**Hands-On Value-at-Risk and Expected Shortfall: A Practical Primer**

Martin Auer,
Springer, 2018

This book describes a maximally simple market risk model that is still practical, and main risk measures like the value-at-risk and the expected shortfall. It outlines the model's underlying math, daily operation, and implementation, while stripping away much of the statistical overhead.

It is aimed at newcomers to the field, at model result consumers, and at market risk practitioners. It strives to give an intuitive insight into how market risk models operate under real-world constraints.

Preface

Acknowledgements

1 Introduction

2 Motivation

3 Basic Terms and Notation

4 Historical Value-at-Risk

5 Sensitivities

6 Stress Tests

7 Analytical Value-at-Risk

8 Expected Shortfall

9 Model Choices

10 A Monte Carlo Modification

11 Support Measures

12 Properties of VaR

13 Properties of ES

14 VaR Noise

15 Backtesting

16 Distribution Tests

17 Nine to Five

18 Context

19 Scope and Workflow

20 Implementation

Conclusion

A Statistics 101

B Pricing

C Further Reading

References

Index

*"A very useful guide to the theoretical and practical aspects of implementing and operating a risk-monitoring system for a mid-size financial institution. It sets a common body of knowledge to facilitate communication between risk managers, computer and investment specialists by bridging their diverse backgrounds."*

**Giovanni Barone-Adesi**

Professor, Università della Svizzera italiana

*"This unassuming and insightful book starts from the basics and plainly brings the reader up to speed on both theory and implementation."*

**Shane Hegarty**

Director Trade Floor Risk Management, Scotiabank

*"Martin Auer's 'Hands On Value-at-Risk and Expected Shortfall' provides a nice easy-to-read, easy-to-use introduction to the VaR topic. The treatment is clear and not too demanding technically, and it provides helpful advice on VaR do's and don't's - something which is often missing in other books."*

**Kevin Dowd**

Professor, Durham University; Author of "Measuring Market Risk"